RFID Production performance Testing
RAIN Xplorer Inline is a Test Solution for High-Speed Quality Assurance and Encoding.
RFID Performance Testing During Production
The CISC RAIN Xplorer Inline is a unit for high-speed performance testing of RAIN RFID inlays and tags during the production process. It offers quality assurance during the production process from start to end. RAIN Xplorer Inline is available with a GUI but also allows full integration into assembly machines through serial interfaces, trigger lines, and API.
Encoding and Locking
The RFID Xplorer Inline system is designed to efficiently encode, test, and lock data on RFID labels in a single, streamlined process. This advanced capability ensures that each RFID label is accurately encoded with the correct data, rigorously tested for performance, and securely locked to prevent unauthorized alterations. By consolidating these steps, the system significantly boosts production efficiency, minimizes the risk of human error, and guarantees the reliability and security of every RFID label. This makes it an essential solution for managing high volumes of RFID labels with precision and confidence.
Key Benefits
- More flexibility in creating an own performance matrix
- Better analysis while saving time and cost
- Testing for performance on multiple frequencies on a single RAIN RFID inlay tag at high speed
- Improves overall quality of the product
- Full quality assurance in production
- Security, crypto support (SAM, TAM)
Key Features
- 800 MHz to 1 GHz
- TX power range from -10 dBm to 28 dBm
- Sensitivity up to -80 dBm
- Read EPC, TID and memory
- Encoding (Write memory)
- Measure tag sensitivity over frequency
- Test time starting at 6 ms per single read EPC test point
- Linear test time scaling, e.g. 30 ms for 5 read EPC test points
- 100k UPH testing for 5 power/frequency pairs on EPC and reporting TID
- GPIO for external trigger
- Serial interface for communication
RAIN Xplorer Inline is a tag performance test tool that additionally allows encoding of RAIN RFID tags and labels. The device is setup that it supports up to 100k UPH for testing the essential points of the tags resonance behaviour, which means 5 power/frequency pairs on EPC and reporting EPC and TID of each tag additional to the pass/fail result. The device consists of 2 elements, the RAIN Xplorer Inline itself and a test antenna. A Secure Access Module, the MIFARE SAM AV3, is provided optionally.
Both inductive and capacitive test antennas with multiple flexible shielding options are provided to meet UHF RFID production testing requirements for any kind of RAIN tags and labels.
The performance test support mode supports reference tag measurements to easily extract performance criteria for the tags. These parameters are then used to define criteria for the high volume quality assurance testing.
