NFC Production Quality
Assurance

NFC Xplorer Inline is a Test Tool for High Speed Quality Assurance and Encoding.

NFC Performance Testing During Production

The CISC NFC Xplorer Inline is a unit for high-speed quality assurance testing of NFC inlays and tags during the production process. It offers quality assurance during the production process from start to end which includes performance testing and encoding. NFC Xplorer Inline is available with a GUI but also allows full integration into assembly machines through serial interfaces, trigger lines, and API.

Encoding and locking

The NFC Xplorer Inline system excels with its ability to seamlessly encode, test, and lock data on NFC labels in one continuous process. This advanced feature guarantees that each NFC label is accurately encoded with the correct data, thoroughly tested for functionality, and securely locked to prevent any unauthorized changes. By integrating these steps, the system enhances production efficiency, reduces the likelihood of human error, and ensures the reliability and security of every NFC label. This makes it an indispensable tool for high-volume, precision-driven NFC label management.

Key Benefits

More flexibility in creating an own performance matrix
Better analysis while saving time and cost
Testing for performance on 13.56 MHz at high speed (> 100k UPH)
Improves overall quality of the product
Full quality assurance in production
Support of various NFC Tag types
Security, crypto support (SAM, TAM)

Key Features

Variable H-field strength
Provided a complete solution including antennas to support for class 1 – 6 tags
Read / Write mode for encoding and personalization
Test label operating field range
GPIO for external trigger
Serial interface for communication
Supported standards:
- ISO/IEC 14443A and B
- ISO/IEC 15693

NFC Xplorer inline is a quality assurance test tool that additionally allows encoding of NFC and HF RFID tags and labels. The device is setup to support the maximum speed allowed by the protocol and the tag chip.The device consists of 2 elements, the NFC Xplorer Inline itself and a test antenna (set). A Secure Access Module, the MIFARE SAM AV3, is provided optionally.

A set of 3 test antennas together with square and round shielding panels are provided covering all NFC tag type classes 1-6 to meet production testing requirements for any kind of NFC tags and labels.